NT-MDT Spectrum Instruments
Leading the Way in Nanoscale Analysis
Our journey has been marked by the creation of a large number of devices, the functions and capabilities of which cover a wide range of customer needs in various fields: university education, academic and industrial research. NT-MDT's pioneering efforts have resulted in an impressive combination of scanning probe microscopy with Raman spectroscopy and advanced optical microscopy techniques.
Atomic force microscopes (AFM) and their combinations with ultra-high resolution spectroscopy.
Key features of our AFMs:
The widest range of AFM modes delivered in standard configurations
The highest level of automation, including but not limited to: self-testing, automated configuration for each AFM mode, laser alignment, tuning of scanning parameters and may more...
Lowest thermal drift